P. Urbański1, S. Sękowski2
1 Institute of Nuclear Chemistry and Technology, 03-195 Warsaw, ul. Dorodna 16, Poland,
2 Institute of Precision Mechanics 00-967 Warsaw, ul. Duchnicka 3
The paper gives general description of radiometric methods for the coating thickness gauging: b-backscattering and X-ray fluorescence. Examples of typical applications of both the methods are presented. The performance of the radiometric gauges is compared with that of other industrial gauses employing various physical principles.The role and place of radiometric instruments among other industrial coating thickness gauges is considered.