The X-ray fluorescence analyzer AF-20 is an instrument designed for fast, non-destructive analysis of the elements with atomic number higher than of sulphur in solid and liquid samples.
Operation of the gauge is based on the use X-ray fluorescence, which enables fast, non-destructive analysis of investigated sample. The analyzer can also be employed to measure coating thickness of samples with diameter higher than 3 mm.
A microprocessor system is used to control the measuring cycle, to process signals from measuring head, and to display them on a digital display. Measuring parameters are set from gauge keyboard. Up to 50 measuring results are stored in RAM memory of the microprocessor. The measuring results are transmitted to external computer through serial or parallel ports.
The gauge finds application in analysis of galvanic bath, of minerals, cement, determination of ash content in coal and thickness measurements of metallic and non-metallic coatings in the range up to a few tens micrometers.